Automatic Defect Classification Solution
It is a solution for categorizing defects using images created
from facilities during the semiconductor/display inspection process, and analyzing and managing them.
Key Technology
Image processing
GPI high-speed computation
Business Domain
Deep learning computation
GAN computation
- ADC (Automatic Defect Classification)
- Auto defect categorization system using images of defects of the review facilities
- GAN ? Generative Adversarial Network