Design For Manufacturing Solution
It is a solution which predicts the vulnerability of
a design using the semiconductor IC design and inspection data and measures actual defects.
Key Technology
Design data utilziation
Image processing
GPU high-speed computation
Business Domain
Deep learning computation
- DAQ (Defect Analysis Quantification)
- A system for measuring defects and monitoring weaknesses by analyzing the wafer inspection image in integration with IC designs.
- DFM ? Design for Manufacturing
- Wafer ? A disc-shaped substrate made of silicon single-crystal. It is used as a raw material for semiconductor integrated circuits.
- GDS ? Graphic Database System
- OASIS ? Open Artwork System Interchange Standard